Experienced yield excellence engineer with over six years of experience in advance process technology. An expert on defect inspection tool. Eager to contribute to team success through excellent problem-solving and organizational skills.
Overview
15
15
years of professional experience
Work History
Yield Excellence Engineer
TSMC
03.2021 - Current
N2 darkfield team leader
N3 PRTCHK defense system evaluation and handle flow optimization
N3 PRTCHK ENG and ETE trainner
N3 CMP_DD recipe sensitivity improvement by pixel migration
N3 Voya 1035 new algo (Super Filter) evaluation for sensitivity improvement
N3 EBI and 8023 team supervisor
N3 BEOL VOYA BKM enhancement, include orientation and pixel migration to small pixel
N2 Voya 1035U/1058/HawkEye SOW
N2 CMP DD tool capability enhancement, include KT Voya1035liteV and AMAT HawkEye
N2 Voya1058 Post NTSC
N2 CIRCL recipe enhancement by optimizing BF light level
AP3 CoWoS Residue 8935 sensitivity improvement
Enlight 3 image enhancement by denoiser-Al algo
N2 CMP_DD automation system setup
Yield Excellence Engineer
TSMC
03.2015 - 03.2021
N5 BEOL & N7 F/M/BEOL dark field inspection recipe setup for inline monitoring.
Inspection recipe BKM mode study and new layers evaluation.