Summary
Overview
Work History
Education
Skills
Timeline
Generic

JINMING LIU

Yield Excellence Engineer

Summary

Experienced yield excellence engineer with over six years of experience in advance process technology. An expert on defect inspection tool. Eager to contribute to team success through excellent problem-solving and organizational skills.

Overview

15
15
years of professional experience

Work History

Yield Excellence Engineer

TSMC
03.2021 - Current
  • N2 darkfield team leader
  • N3 PRTCHK defense system evaluation and handle flow optimization
  • N3 PRTCHK ENG and ETE trainner
  • N3 CMP_DD recipe sensitivity improvement by pixel migration
  • N3 Voya 1035 new algo (Super Filter) evaluation for sensitivity improvement
  • N3 EBI and 8023 team supervisor
  • N3 BEOL VOYA BKM enhancement, include orientation and pixel migration to small pixel
  • N2 Voya 1035U/1058/HawkEye SOW
  • N2 CMP DD tool capability enhancement, include KT Voya1035liteV and AMAT HawkEye
  • N2 Voya1058 Post NTSC
  • N2 CIRCL recipe enhancement by optimizing BF light level
  • AP3 CoWoS Residue 8935 sensitivity improvement
  • Enlight 3 image enhancement by denoiser-Al algo
  • N2 CMP_DD automation system setup

Yield Excellence Engineer

TSMC
03.2015 - 03.2021
  • N5 BEOL & N7 F/M/BEOL dark field inspection recipe setup for inline monitoring.
  • Inspection recipe BKM mode study and new layers evaluation.
  • Inspection recipe sensitivity, WPH & nuisance improvement.
  • Dark field inspection tool & EDR7380 review tool sponsor.
  • Inline production defect analysis by KLA inspection tool.
  • EBI team supervisor and building team spirit through effective communications.
  • N16 BEOL Lithography weekly defect summary and loop sponsor.
  • Established project schedules and monitored tasks to meet milestones.

Thin Film Process Engineer

TSMC
08.2010 - 03.2015
  • Fab8 2012 CIT Award 3rd prize.
  • Reviewed thin film processes, identifying areas that required improvement.
  • Identified problems and recommended new processes to improve efficiency.
  • Applying statistics process control methods to establish and sustain a robust manufacturing process.

Education

Master of Science - Department of Chemical Engineering

National Tsing Hua University

Bachelor of Science - Department of Chemical Engineering

National Cheng Kung University

Skills

  • Dark-field inspection tool expert (VOYA,PUMA)

Timeline

Yield Excellence Engineer

TSMC
03.2021 - Current

Yield Excellence Engineer

TSMC
03.2015 - 03.2021

Thin Film Process Engineer

TSMC
08.2010 - 03.2015

Master of Science - Department of Chemical Engineering

National Tsing Hua University

Bachelor of Science - Department of Chemical Engineering

National Cheng Kung University
JINMING LIUYield Excellence Engineer